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Hewlett-Packard Application Notes

 

Introduction by John Minck

In a real sense, Hewlett-Packard sold MEASUREMENTS as well as products. According to one marketing professional, when you go to a hardware store to buy a 5mm drill bit, what you really want is a 5mm hole. So, likewise, as HP developed their massive line of innovative measurement instruments, the customers often had to be educated in the newer processes of the new measurement techniques, permitted by the newest product.

In-depth discussions of important techniques developed by HP engineers and written by them are published in the Hewlett-Packard Application Note Series. You will find here a listing of the Hewlett-Packard Application Notes available. Further work will be done to make the following table interactive with the project DataBase. At this stage of the Web Site development, the listing gives the following information:

  • AN-Nbr - The original numerical classification made by HP.
  • DATE - When their is one appearing somewhere in the application note.
  • Related Instr - The instrument for which the application note has been edited (if any). Or the
    instrument typical of the AN subject. XX number completion is frequently used and
    the "++" notation stand for "reference to the overall product line of the instrument listed"
  • TITLE - The exact title and sub-title if any of the application note..

In the HP numbering and archiving strategy, Application Note titles were assigned to generic measurement tutorials, which might cover multiple instrument numbers. Another category of technical notes were called Product Notes. Product Notes were instrument-specific and although a wide range of topics were permitted, in general, PNs expanded on instrument performance characteristics beyond the Technical Data Sheet of product descriptions and specs.

Application Notes Recently Scanned and Added as downloadable PDF Files

Date AN Nbr T I T L E
Jul-12-2008 AN 77s AN77-1,2,3,4, 8405A Vector-VM Series (Thanks to J.M. STRICKER for the scans)
Apr-05-2008 AN 150s Spectrum Analysis AN150 Series Up to AN150-13 (See also NEWS Chapter)
Mar-22-2008 AN 37 Monitoring a Radio Transmitter Signal with a 120A or 130A Oscilloscope
Mar-22-2008 AN 63C Measurement of White Noise Power Density
Mar-22-2008 AN 93 Electronic Application of the 5400A
Mar-22-2008 AN 102 Program Controllers (HP-Moseley Division)
Dec-21-2007 AN 207 Understanding and Measuring Phase Noise in the Frequency Domain
Nov-30-2007 AN 346 A Guideline for Designing External DC Bias Circuits

Download it from the listing below


Application Notes
AN-Nbr DATE Related Instr TITLE
3 ? - Measurement of RF Pulse Carrier Frequency
6 ? - Homodyne Generator and Detection System
6-65 1965? 69XX DC Power Supplies - Harrison/HP
7 ? 430C Hewlett-Packard Model 430C Microwave Power Meter Accuracy
9 ? 490A Doppler Frequency Shit Simulation at Microwave Frequencies using Traveling Wave Tube Amplifier
10 ? - Microwave Spectrum Synthesis with the Traveling-Wave Tube
11 1955 - Domesticating the Traveling Wave Tube
12 1959 - How a Helix Backward-Wave Tube Works
14 1955 49X Traveling-Wave Tube Amplifiers
16 1964 - Waves on Transmission Lines
17 1966 - Square Wave & Pulse Testing of Linear Systems
18 1959 - Introduction to Solid State Devices
20 1961 612A Signal Generator Output Attenuators
20 1965 612A HP Signal Generator Output Attenuators
21 1961 - Microwave Standards Prospectus
24 ? - Pulse Modulation of Audio Oscillators
25 1961 120-130-1XX Cathode Ray Tube Phosphors and the Internal Graticule Cathode Ray Tube
29 ? - A Convenient Method for Measuring Phase Shift (With CRT Graticul Mask)
30 1964 608-803-417 Measurement of Cable Characteristics
31 ? 202A Externally Driving the 202A Low Frequency Function Generator
32 1963 50X-56X Guide for Selecting HP and DYMEC Digitizing Instruments for Specific Applications
36 ? - Sampling Oscillography
37 1959 120A-130A Monitoring a Radio Transmitter Signal with a 120A or 130A Oscilloscope
38 1962 - Microwave Measurements for Calibration Laboratories
41A 1960 405AR A Hold-Off Circuit for the Model 405AR Digital Voltmeter
41B 1960 405AR Increased Resolution for Permanent Records of DC Voltage with hp Model 405AR
41D 1960 405AR Decreasing the Response Time of the Model 405 Input Filter
43 1960 344A Continious Monitoring of Radar Noise Figure
44A 1960 185A Synchronizing the hp 185A Oscilloscope
44B 1960 185A More Information and Easier Pulse Analysis with the Model 185A Oscilloscope
44D ? 18X Characteristics and Use of hp Sampling Oscilloscope Probe and Accessories
45 1963 428A Direct Reading Test Meter Simplifies Magnetic Ink Printing Quality Control
47 1961 524C-D Providing 100-, 1,000-, and 10,000-Second Gate Times for the hp Model 524C/D Counter
48 1965 218A Applications of the hp Model 218A, a Versatile General-Purpose Pulse and Delay Generator
52 1965 5060A ++ Frequency and Time Standards
52-1 1974 - Fundamentals of Time and Frequency Standards
52-2 1975 - Timekeeping and Frequency Calibration
53 1962 185B Transmission Line Testing Using the Sampling Oscilloscope
55 1962 302A Converting the Model 302A Wave Analyzer for Use with Grounded-Input Recorders
56 1967 - Microwave Mismatch Error Analysis
57 1965 34X Noise Figure Primer
57-1 1983 8970A Fundamentals of RF and Microwave Noise Figure Measurements
57-1 2000 859X-NFA Agilent Fundamentals of RF and Microwave Noise Figure Measurements
57-2 1988 8970B Noise Figure Measurement Accuracy
57-2 2001 8590X-346X Noise Figure Measurement Accuracy - The Y-Factor Method
57-3 2000 - 10 Hints for Making Successful Noise Figure Measurements
58 1963 8714A The PIN Diode as a Microwave Modulator
58 1967 - The PIN Diode as a Microwave Modulator
59 1965 310-1110A Loop Gain Measurement with hp Wave Analyzers
60 1967 4XX-34XX Which AC Voltmeter ?
61 1964 690-691-130C Leveled Swept-Frequency Measurements with Oscilloscope Display
62 1964 1415A Time Domain Reflectometry
62 1988 54120T TDR Fundamentals - For Use with hp 54120T Digitizing Oscilloscope and TDR
62-1 1988 54120T Improving Time Domain Network Analysis Measurements
62-2 1990 54120 TDR Technics for Differential Systems
62-3 1990 541XX Advanced TDR Technics
63 1968 8551A Spectrum Analysis
63A 1967 8551A More on Spectrum Analysis
63B 1968 8441A The 8441A Preselector : Advancement in the Art of Spectrum Analysis
63C ? 8551A Measurement of White Noise Power Density
63D 1968 8551A-8406A Accurate Frequency Measurement: An Application of Spectrum Analysis
63E 1969 8551A Modern EMI Measurements
63E-1 1978 - Quasi-Peak Measurements Using a Spectrum Analyzer
63E-1 ? - Quasi-Peak Measurements Using a Spectrum Analyzer - Corrective of AN63E-1 Above
64 1965 43X Microwave Power Measurement
64 1968 43X Microwave Power Measurement
64-1 1977 43X Fundamentals of RF and Microwave Power Measurements
64-1A 1997 EPM-44X Fundamentals of RF and Microwave Power Measurements
64-2 1978 436A Extended Applications of Automatic Power Meters
64-3 1980 436A-346A Accurate and Automatic Noise Figure Measurements
64-4A 1997 EPM-44X 4 Steps for Making Better Power Measurements
65 1965 690C-D Swept Frequency Techniques
66 1965 690 Swept SWR Tests in X-Band Coax
67 1968 1415A-1815B Cable Testing with Time Domain Reflectometry (With TDR Slide Rule)
68 1965 8614-8616B Accurate Receiver Sensitivity Measurements
69 1965 34XX ++ Which DC Voltmeter
70 1969 740-741B Precise DC Measurements
71 1966 606-608 Advances in RF Measurements Using Modern Signal Generators 50Kc-480Mc
72 1966 5201L-5551A Integral Counting
73 1966 5201L-5551A Calibration of a Gamma Ray Spectrometer
75 1966 1415A Selected Articles on Time Domain Reflectometry Applications
76 1967 230A Using the 230A Power Amplifier
77-1 1967 8405A Transistor Parameter Measurements
77-2 1966 8405A Precision Frequency Comparison
77-3 1967 8405A Measurement of Complex Impedance 1-1000 MHz
77-4 1968 8405A Swept-Frequency Group Delay Measurements
78-1 1966 DYMEC-2801 Calibrating the Quartz Thermometer
78-2 1966 DYMEC-2801 Molecular Weight Determination with the Quartz Thermometer
78-3 1968 HP2801A Calorimetry and the Quartz Thermometer
78-4 1968 HP2801A A Glossary of Terms Pertaining to Temperature Measurements
78-5 1971 HP2801A Applications of the Quartz Crystal Thermometer
81 1967 203A Low Frequency Phase Shift Measurement Techniques
82 1966 - Power Supply/Amplifier Concepts and Modes of Operation
83 1966 - Increased Output Resistance for DC Regulated Power Supplies
84 1967 1416A Swept SWR Measurement in Coax
85 1966 5280A Using a Reversible Counter
86 1968 4800A-4815A Using the Vector Impedance Meters
87 1967 5210A FM and PM Measurements
88 1970 - Logic Symbology
89 1967 3960-3968 Magnetic Tape Recording Handbook
90 1967 HP-HARRISON DC Power Supply Handbook
90B 1978 HP-Only DC Power Supply Handbook
91 1968 8405A How Vector Measurements Expand Design Capabilities 1 to 1000 Mhz
92 ? 8410 Network Analysis at Microwave Frequencies
93 1969 540X Statistical Analysis of Waveforms and Digital Time-Waveform Measurements
93 ? 5400A Electronic Application of the 5400A (Technical Information Note 93)
94 1968 - Connector Design Employing TDR Techniques
95 1968 8410 ++ S-Parameters… Circuit Analysis and Design
95A 1973 - Selected Reprints on S-Parameters… Circuit Analysis and Design
95-1 ? - S-Parameter Techniques for Faster, More Accurate Network Design (Paper part of AN95)
96 1969 5105-5110B HP Direct-Type Frequency Synthesizers Theory, Performance and Use
98-1 ? 3722A Noise at Work - Model 3722A Aids Design of Process Control Systems
98-2 1969 H01-3722A Noise at Work - A Point by Point Correlator for the H01-3722A
99 1968 8541A 8541A Automatic Network Analyzer Measurement Capabilities
100 1968 - Acoustics Hanbook
101 1963 7560-7561A Multiplication and Division by Logarithms (HP-Moseley Division)
102 1963 7000-7100 Program Controllers (HP-Moseley Division)
105 1961 MOSELEY Polarography
105 1967 - Polarography (HP-Moseley Division)
106 1967 135-Moseley Electric Motor Testing Performance (HP-Moseley Division)
107 1965 - Guard Circuits (HP-Moseley Division)
108 1966 101-Moseley Hysteresis Curve Plotting (HP-Moseley Division)
109 1969 62XX Power Supply Overvoltage "CROWBARS"
110 1968 8410 Anrenna/Radome Boresight Error Measurements
112-1 1968 675-676A Low-Frequency Network Analysis with the 675A/676A
112-2 1969 675-676A Using the 675A/676A Network Analyzer as an Educational Tool
114 1969 653A A2A Video Transmission System Alignment
115 1970 - Principles of Cathode-Ray Tubes, Phosphors, and High-Speed Oscillography
116 1969 5360A Precision Frequency Measurements
117-1 1970 8410 Microwave Network Analyzer Applications
117-2 1971 8410-11608A Stripline Component Measurements with the 8410A Network Analyzer
118 1970 1815A Dielectric Measurements with Time Domain Reflectometry
120 1969 5360A A New Technique for Pulsed RF Measurements
120-2 1970 5360A Measuring Phase with the 5360A Computing Counter
120-3 1970 5360A Non-Linear Systems Applications of the Computing Counter System
121-1 1970 8407A Network Analysis with the HP 8407A 0,1 - 110 MHz
121-2 1970 8407A Swept Impedance with the HP 8407A 0,1 - 110 MHz
123 1970 - Floating Measurements and Guarding
124 1970 - True RMS Measurements
125 1970 3480B-2912A Data Acquisition - 3480B Digital Voltmeter - 2912A Scanner - 2547A Coupler
126 1970 3590A Theory and Applications of Wave Analyzers
127 1970 5480B Signal Averaging Enhancement of RF and Pulse Measurements
128 1970 6177B-618XB Applications of a DC Constant Current Source
129 ? - Logic Timing Measurements
130 1970 2570A Instrumentation Control with the HP Coupler/Controller
131 1971 2570-2575A Time-Sharing Based Instrumentation Terminal
132 1971 2570A-9100 Calculator Based Instrumentation Systems
133-1 1971 3480-180A Low Frequency Pulse Amplitude Measurements
133-2 1971 3485A A Guide to Remote Control of the 3485A Scanning Unit
133-3 1971 3480-2070A A Guide to Using Data Storage
133-4 1972 3480-2070A A Guide to Using Sample-and-Hold
134 1971 8556A-8552B Audio Frequency Measurements with the 8556A-8552B Spectrum Analyzer
135-1 1971 2116 ++ Computerized Data Acquisition Aids Final Testing
135-2 1971 2116 ++ High-Volume Production Testing
135-3 1971 2116 ++ Process Monitoring in Manufacturing
135-4 1971 2116 ++ Closed-Loop Production Testing
135-5 1971 2116 ++ A Mobile Process Control Laboratory
135-6 1971 2116 ++ Computer Analysis Aids Battery Testing
135-7 1971 2114-2116 ++ Data Acquisition and Analysis at Sea
135-8 1971 2116 ++ Minicomputer System Aids Busy Psychology Lab
135-9 1971 2116 ++ In-Flight Data Analysis Improves Airborne Research
135-10 1971 2114 ++ Computer Speeds Gas Turbine Combustor Testing
135-11 1971 2116 ++ Stable Measurements on the High Seas
135-12 1971 2116 ++ Depot Testing of Avionic Modules
135-13 1973 2116 ++ Domestic Communications Satellites - A World's First
135-14 1972 2115 ++ Computerized Process Control Improves Sugar Refinery Production
135-15 1972 2116 ++ Minicomputer System Benefits Fuel Cell Technology
135-16 1972 2116 ++ Minicomputer Systems Aid Military Vehicle Testing
135-17 1972 2116 ++ Testing Ovonic Read-Mostly Memories
135-18 ? 2100A ++ An Automated Engine Laboratory in a Research Environment
135-19 1972 2116 ++ Testing Thick-Film Hybrid Circuits
135-21 1973 9500 ++ Viggen Avionics Support
135-22 1973 2100 ++ Real-Time Multiprogramming System Boosts Productivity for NCR
135-23 1973 9500 ++ Television Set Production Revolutionized by Automatic Alignment and Test
135-24 1973 2100A ++ Automated System Improves Spacecraft Testing
135-25 1973 2116 ++ Automation in Production Testing
136 1973 8445B-8555A Understanding and Operating the 8555A Spectrum Analyzer and 8445B Preselector
137 1971 4470A Probing Transistor Noise
138 1971 5401B Multichannel Analyzer Applications
139 1971 5586A Stabilizing Gamma-Ray Spectrometer Systems with the HP 5586A Spectrum Stabilizer
140-0 ? 5450 Fourier Analayser Training Manual
140-1 1971 5450 Detecting Sources of Vibration and Noise Using HP Fourier Analyzers
140-2 1971 5450 Feedback Loop and Servomechanism Measurements Using HP Fourier Analyzers
140-3 1972 5451 Dynamic Testing of Mechanical Systems Using Impulse Testing Techniques
140-4 ? 5451 Digital Auto-Power Spectrum Measurements
140-5 1973 5451 Measurement of Transfer Functions with Wide Dynamic Range
140-6 1973 5451 Measurement of Machine Tool Vibration
140-7 1974 5451 Nuclear Power Plant Diagnostics Using Fourier Analysis Techniques
141 1971 5257A AM, FM Measurements with the Transfer Oscillator
142-XX 1968 8551 EMI Measurement Procedure (With 8551 Calibration Slide Rule)
142 1972 855X EMI Measurement Procedure
144 ? - Understanding Microwave Frequency Measurements
145-1 1971 2000C First Small Computer Solution to Text Editing Systems
145-2 1971 2114 Minicomputer Untangles Massive Inventory Problem in Heavy Industry
145-3 1971 2116B Flexible Computer-Controlled Laser System Revolutionizes Garment Industry
145-4 1971 2000C Inexpensive Time-Share System Solves Unique College Registration Problems
145-5 1971 2000C Computer System Helps Graduate Business School Teach Management Technology
145-6 1972 2000C Dedicated Time-Sharing Fills Multitude of Management Needs
145-7 1972 2000B Computer System Helps Motivate High School Students
145-8 1972 - Minicomputer Systems Improve Auto Maker's Production Efficiency
145-9 1972 2120A Low-Cost Batch System Streamlines Construction Projects
145-9 1973 2100 Microprogrammable Mini Expand University Computer Science Program
145-10 1972 2100A Rugged Minicomputer System Helps Ships Find the Sure, Safe Way
145-11 1972 2000X Time-Shared Systems Expand Scope of Education
145-12 1972 2000 Inexpensive Computer System "Does it All" for Small Manufacturer
145-13 1972 2000 Computer Systems Raise Student Achievement Levels
145-14 1972 2100 Small Computer System Pinpoints Suspects for Police Departments
145-15 1973 2000 Computer Systems Help University Provide Quality, Personalized Instruction
145-16 1973 2100 Small Computer System Keeps Apparel Industry in Style
145-17 1973 2000 Versatile Computer Systems Streamlining Hawaiian Industry
145-18 1973 2100 Small Computer System Keeps Meteorologists on Top of the Weather
145-19 1973 200X Small System Provides Bank with Versatile New Problem-Solver
145-20 1973 2100 Efficient Computer Systems Help Firm Maintain Competitive Edge
145-25 1974 200X Computer Network Connects Field Offices and Manufacturing Divisions
150 1974 855X Spectrum Analysis…. Spectrum Analyzer Basics
150 1989 70XXX Spectrum Analysis…. Spectrum Analyzer Basics
150A 1973 8558B Spectrum Analysis…. Using the 8558B Spectrum Analyzer
150B 1978 8557A-8558B Spectrum Analysis…. Using the 8557A and 8558B Spectrum Analyzers
150-1 1971 855X Spectrum Analysis Amplitude and Frequency Modulation
150-1 1989 - Spectrum Analysis Amplitude and Frequency Modulation
150-2 1971 855X Spectrum Analysis…. Pulsed RF (With Pulsed RF Calculator Slide Rule)
150-3 1974 855X-8444A Spectrum Analysis…. Swept Frequency Measurements and Selective Frequency Counting with a Tracking Generator
150-4 1974 855X Spectrum Analysis…. Noise Measurements
150-5 1973 855X Spectrum Analysis…. CRT Photography and X-Y Recording Techniques
150-6 1974 855X Spectrum Analysis…. CATV Proof of Performance
150-7 1975 855X Spectrum Analysis…. Signal Enhancement
150-8 1976 855X Spectrum Analysis…. Accuracy Improvement
150-9 1976 855X Spectrum Analysis…. Noise Figure Measurement
150-10 1976 855X Spectrum Analysis…. Field Strength Measurement
150-11 1976 855X Spectrum Analysis…. Distorsion Measurement
150-12 1977 8565A-11517A Spectrum Analysis…. Using the HP 11517A External Mixer to 40 GHz
150-13 1978 8565A-8709A Stimulus-Response Measurements… Using the HP 8565A Spectrum Analyzer from 2-18 GHz
150-14 1978 855X Spectrum Analysis…. Using External Waveguide Mixers Above 40 GHz
151 1973 - Fundamentals of Air Navigational Systems
152 1972 - Probing in Perspective
153 1972 1415A-1815A Permeability, Permittivity and Conductivity Measurements with Time Domain Reflectometry
153-1 1997 815X The Basics of Fiber Optic Measurement and Calibration
154 1972 8410 ++ S-Parameter Design
154 1990 8510-875X S-Parameter Design
155-1 1976 8755 ++ Active Device Measurements with the HP 8755 Frequency Response Test Set
155-2 1977 8755 ++ 100 dB Dynamic Range Measurements Using the HP 8755 Frequency Response Test Set
155-3 1981 8755S Automating the HP 8755 Scalar Network Analyzer
156-1 ? 5526A Laser Measurement System - Remote Laser Interferometry
156-2 ? 5526A Laser Measurement System - Calibration of a Surface Plate
156-3 1972 5510A Laser Measurement System - Principles of Automatic Compensation
156-4 ? 5526A Laser Measurement System - Calibration of a Machine Tool
156-4 ? 5526A Système de Mesure à Laser - Etalonnage d'une Machine Outil (French Translation of AN 156-4)
156-5 1976 5526A Laser Measurement System - Measurement of Straightness of Travel
156-5 1979 5526A Système de Mesure à Laser - Mesure de la Rectitude d'un Déplacement (French Translation of AN 156-5)
157 ? 3570-3575 ++ Low Frequency Gain Phase Measurements
158 1973 34XX ++ Selecting the Right DVM
161-1 ? 9800-9830 Structural Engineering Applications - HP Series 9800 - The Name and Number That Save Time and Money
161-2 ? 9800-9830 Electrical Engineering - Transformer Engineers Save Time, Improve Accuracy with Calculator-Aided Design
162-1 ? 5326-5327 Time Interval Averaging
163-1