Hewlett-Packard Application Notes

The listing gives the following information:
| AN Number | DATE | Related Instr | TITLE |
|---|---|---|---|
| AN-200 | 1978 | 53XX | Fundamentals of the Electronic Counters |
| AN-200 | 1997 | 53XX | Fundamentals of the Electronic Counters |
| AN-200-1 | 1977 | 53XX | Fundamentals of Microwave Electronic Counters |
| AN-200-1 | 1997 | 53XX | Fundamentals of Microwave Electronic Counters |
| AN-200-2 | ? | - | Fundamentals of Quartz Oscillators |
| AN-200-3 | ? | 53XX | Fundamentals of Time Interval Measurements |
| AN-200-4 | 1997 | 53XX | Understanding Frequency Counter Specifications |
| AN-201-1 | 1976 | 2108A ++ | Automatic Q-A Evaluation of Precision Resistors |
| AN-201-2 | 1976 | 2108A ++ | Measuring Differential Non-Linearity of a Voltage-Controlled Oscillator |
| AN-201-3 | 1976 | 2113A ++ | A Multiple Station Electronic Test System |
| AN-201-4 | 1977 | HP1000 ++ | Performance Evaluation of HP-IB Using RTE Operating Systems |
| AN-201-5 | 1977 | HP1000 ++ | The HP-IB Link: Control of Distributed HP-IB Devices |
| AN-201-6 | 1980 | HP1000-9825 | Computer Communications: HP 9825 - HP 1000 |
| AN-201-7 | 1978 | HP1000-3455 | High-Performance Software for the HP 3455A/3495A Subsystem |
| AN-201-8 | 1979 | HP1000 ++ | The Use of Device Subroutines with the HP 1000 Computers |
| AN-202-01 | 1976 | 2100S-7260A | Optical Mark Reader Substantially Incease Productivity |
| AN-202-03 | 1976 | 7261A | Distributed Hewlett-Packard Optical Mark Readers Provide Easy Remote Data Collection |
| AN-204-1 | 1977 | 3050B | Automatic Accelerometer Calibration Helps Assure Air Dropped Cargo Survivability |
| AN-204-2 | 1977 | 3050 | Energy Conservation in a Restaurant - Measurement / Computation Using Hewlett-Packard's Data Aquisition System |
| AN-205-1 | 1977 | 3042A | Low Frequency Amplitude Considerations of 3042A System |
| AN-205-2 | 1979 | 3042A | Sonar Transducer Calibration - Measurement and Computation with Hewlett-Packard's 3042A Automatic Network Analyzer System |
| AN-206-1 | 1977 | 3045A | Measuring Wideband Noise with the HP 3045A Automatic Spectrum Analyzer |
| AN-207 | 1976 | 3045A | Understanding and Measuring Phase Noise in the Frequency Domain |
| AN-210-1 | ? | DTS-70 | Digital Test System - Modeling and Simulation for Digital Testing |
| AN-210-4 | ? | DTS-70 | Digital Test System - Designing Digital Circuits for Testability |
| AN-212-1 | 1977 | HP1000 | Building an Inventory Control Data Base |
| AN-212-2 | 1977 | HP1000 | Building an Order Processing Data Base |
| AN-214-1 | 1977 | 704X | Recording with Input Noise Present |
| AN-214-2 | 1977 | 704X | X-Y Recorder Dynamic Response |
| AN-214-3 | 1977 | 704X | X-Y Recorder Input Connection Configuration and Input Noise |
| AN-214-4 | 1977 | 704X | High-Sensitivity X-Y Recorder Has Few Input Restrictions |
| AN-216 | ? | 3570A-3571A | A Guide to the Use of HP3570A and 3571A Analyzers |
| AN-218-1 | 1977 | 8671A-8672A | Applications & Performance of the 8671A and 8672A Microwave Synthesizers |
| AN-218-2 | 1977 | 8671A-8672A | Obtaining Millihertz Resolution from the 8671A & 8672A |
| AN-218-3 | 1978 | 8660-8672A | A 1 MHz to 18 GHz Signal Generator with 1, 2, or 3 Hz Resolution |
| AN-218-4 | 1979 | 8672-938-940A | Synthesized Signals from 18 to 37,2 GHz Using the 8672A |
| AN-218-5 | 1981 | 8672A-11720A | Obtaining Leveled Pulse-Modulated Microwave Signals from the HP 8672A |
| AN-219 | 1977 | 8505A | HP 8505A RF Network Analyzer Basic Measurements |
| AN-220 | 1977 | 8565A | Operating the HP 8565A Spectrum Analyzer |
| AN-221 | 1977 | 8410B-9825A | Semi-Automatic Measurements Using the 8410B Microwave Network Analyzer and the 9825A Desk-Top Computer |
| AN-221A | 1980 | 8410B | Automating the HP 8410B Microwave Network Analyzer |
| AN-222 | 1977 | 5004A | A Designer's Guide to Signature Analysis |
| AN-222 | 1977 | 5004A | Guide d'Utilisation de l'Analyse de Signature (French Translation of AN 222) |
| AN-222-1 | ? | 3060A | Implementing Signature Analysis for Production Testing with the HP 3060A Board Test System |
| AN-222-2 | 1979 | 5004A | Application Articles on Signature Analysis |
| AN-222-3 | 1980 | 5004X | A Manager's Guide to Signature Analysis |
| AN-222-4 | 1977 | 2240A | An Intelligent Analog/Digital Subsystem to Simplify Product Test and Equipment Control - Signal Conditioning: HP 22914A Card |
| AN-222-5 | 1982 | 500X-HP85 | Increasing Productivity in Manufacturing and Service with a Logic Troubleshooting System |
| AN-222-6 | 1983 | 5006A | Troublshooting with Composite Signatures |
| AN-222-11 | 1981 | 500X | A Signature Analysis Case Study of a 6800-Based Display Terminal |
| AN-222-12 | 1982 | A Signature Analysis Based Test System for ECL Logic | |
| AN-223 | ? | 1600A-1741A | Oscilloscope Measurements in Digital Systems |
| AN-224-1 | 1977 | 2240A | An Intelligent Analog/Digital Subsystem to Simplify Product Test and Equipment Control - Measurement and Control Examples |
| AN-225 | 1978 | 5390A | Measuring Phase Spectral Density of Synthesized Signal Sources Exhibiting F0 and F-1 Noise with the 5390A Freq. Stability Analyzer |
| AN-225-1 | ? | 5390A | Measurement Considerations when Using the 5390A Option 010 |
| AN-226 | 1977 | 9850A-9825A | Automatic Transceiver Testing with the 8950A |
| AN-227 | 1977 | 8016A | Word Generator Techniques in Multi-Channel Applications |
| AN-229-1 | 1977 | 7221A | HP-Plot/21 Software Conversion Guide |
| AN-231-1 | 1979 | 3779 | Single Channel Codec Testing |
| AN-231-2 | 1983 | 3779 | Codec Testing with the HP 3779C/D Primary Multiplex Analyzer |
| AN-231-3 | 1984 | 3779 | Making Telecommunications Measurements in Complex Impedances |
| AN-233-1 | 1981 | 1610A | Funtional Analysis of Signetics 2650 Microprocessor Systems Using the 1610A |
| AN-233-2 | ? | 1610A | Funtional Analysis of TMS 9900 Microprocessor Systems Using the 1610A |
| AN-233-3 | ? | 1610A | Funtional Analysis of Z80 Microprocessor Systems Using the 1610A |
| AN-233-4 | ? | 1610A | Funtional Analysis of 8080 Microprocessor Systems Using the 1610A |
| AN-233-5 | ? | 1610A | Funtional Analysis of 6800 Microprocessor Systems Using the 1610A |
| AN-233-6 | 1980 | 1610A-B | Functional Analysis of HP-1000 L-SeriesComputer Using the 1610A/B |
| AN-233-7 | 1980 | 1610A-B | Computer Performance Analysis Using the 1610A/B |
| AN-234-1 | 1977 | 8568A | 8568A Spectrum Analyzer Operation |
| AN-235 | ? | 654A-3320C | An Introduction to Balanced Circuits and Impedance Matching |
| AN-236-1 | 1977 | - | A "MAKE" or "BUY" Analysis for Power Supplies |
| AN-236-2 | 1979 | - | Two Power Supply Redundancy Schemes |
| AN-236-4 | 1981 | 65000 | EMI/RFI and HP 65000A Series Power Supplies - Meeting FCC and VDE Requirements for Computing Equipment |
| AN-238 | 1980 | 4140B | Semiconductor Measurements with the HP 4140B Picoammeter / DC Voltage Source |
| AN-238-1 | 1981 | 4140B-HP85 | Ultra Low Current Semiconductor DC Parameter Measurement System using HP 4140B |
| AN-240-0 | 1977 | 5420A | Analyse Numérique de Signaux (French Translation of AN 240-0) |
| AN-240-1 | ? | 5420A | Digital Signal Analysis - Feedback Control System Measurements |
| AN-240-1 | 1979 | 5420A | Analyse Numérique de Signaux - Mesure sur les Systèmes Asservies (French Translation of AN 240-1) |
| AN-240-2 | ? | 5420A | Improving the Accuracy of Structural Response Measurements |
| AN-240-2 | ? | 5420A | Amélioration de la Précision des Mesures de Réponse de Structures Mécaniques (French Translation of AN 240-2) |
| AN-243 | 1994 | 3582A | The Fundamentals of Signal Analysis |
| AN-243-1 | 1983 | 358X | Effective Machinery Maintenance Using Vibration Analysis |
| AN-243-1 | 1994 | 3562 | Effective Machinery Measurements Using Dynamic Signal Analyzers |
| AN-243-1 | 1983 | 358X | Maintenance de Machines par l'Analyse de Vibration (French Translation of AN 243-1) |
| AN-243-2 | 1991 | 3562 | Control System Development Using Dynamic Signal Analyzers |
| AN-243-2 | 1987 | 3562 | Measuring Switching Power Supply Stability with the HP 3562A (Supplement of AN 243-2) |
| AN-243-3 | 1992 | 3562 | The Fundamentals of Modal Testing |
| AN-243-4 | 1991 | 3562 | Fundamentals of the Z-Domain and Mixed Analog/Digital Measurements |
| AN-243-5 | 1992 | - | Control System Loop Gain Measurements |
| AN-243-6 | 1992 | 3562-3577 | Control System Measurement Fundamentals Using Dynamic Signal Analyzers and Accessories |
| AN-243-7 | 1995 | 358X | Bearing Runout Measurements |
| AN-245-1 | ? | 3582A | Signal Averaging with the 3582A Spectrum Analyzer |
| AN-245-2 | ? | 3582A | Measuring the Coherence Function with the 3582A Spectrum Analyzer |
| AN-245-3 | ? | 3582A | Third Octave Analysis with the 3582A Spectrum Analyzer |
| AN-245-4 | 1979 | 3582A | Accessing the 3582A Memory with HP-IB |
| AN-245-5 | 1979 | 3582A | Log Sweep with the 3582A Spectrum Analyzer |
| AN-246 | 1978 | 3585A | Using the HP 3585A Spectrum Analyzer with the HP 9825A Computing Controller |
| AN-246-1 | 1979 | 3585A | Optimizing the Dynamic Range of the HP 3585A Spectrum Analyzer |
| AN-246-2 | 1981 | 3585A | Measuring Phase Noise with the HP 3585A Spectrum Analyzer |
| AN-250-1 | 1978 | - | HP-IB / Power Supply Interface Guide |
| AN-250-2 | 1979 | - | Battery Charging / Discharging (Lab & Industrial Power Sources) |
| AN-260-1 | ? | 1615A | Understanding Hewlett-Packard's Model 1615A Logic Analyzer |
| AN-262 | 1978 | 1725A | Eliminating Time-Base Errors from Oscilloscope Measurements |
| AN-263 | ? | 10023A | Thermal Measurements of Electronic Components Using the Hewlett-Packard Temperature Probe |
| AN-270-1 | 1978 | 8568A | An Example of Automatic Measurement of Conducted EMI with the HP 8568A Spectrum Analyzer |
| AN-270-2 | 1980 | 8568A | Automated Noise Sideband Measurements Using the HP 8568A Spectrum Analyzer |
| AN-271-1 | 1978 | 1350A-9825A | Adding Soft Copy Graphics to 9825A Based HP-IB Systems Using the Model 1350A Graphic Translator |
| AN-272 | 1978 | 1743A | Precise Time Interval Measurements Using the Crystal Controlled Time Base Model 1743A Oscilloscope |
| AN-275 | 1979 | 1640A | Symptomatic Troubleshooting of Computer Networks with the HP 1640A |
| AN-275-1 | 1979 | 1640A | Using the HP 1640A Serial Data Analyzer with the Epitape Recorder |
| AN-275-2 | 1979 | 1640A | Using the HP 1640A Serial Data Analyzer with the Spectron T-511 Tape Unit |
| AN-276 | 1980 | 133X | Continuous Tone Imaging with Cathode-Ray Tube Displays |
| AN-280-1 | ? | 1602A | Making Complex Measurements with the HP Model 1602A Logic State Analyzer |
| AN-280-2 | 1978 | 1602A | Monitoring the IEEE-488 Bus with the 1602A Logic State Analyzer |
| AN-280-3 | 1978 | 1602A | The 1602A Logic State Analyzer As An Automatic Test Instrument |
| AN-280-4 | 1979 | 1602A | Using 1602A's for Measurements on Wide Buses in Manual and Automatic Modes |
| AN-281-1 | 1978 | HP1000 | A Way to Get Higher Performance from HP 1000 Computers |
| AN-281-2 | 1978 | HP1000 | HP 1000 M-Series to E-Series Microprogram Conversion |
| AN-281-3 | 1978 | HP1000 | Using the HP 1000 E-Series Microprogrammable Processor Port |
| AN-282-1 | 1978 | 6940B | 6940B Multiprogrammer System Throughput Analysis for Multiprogrammer Systems Using the 9825A Desktop Computer |
| AN-283-1 | 1981 | 8662A | Applications and Measurements of Low Phase Noise Signals Using the 8662A Synthesized Signal Generator |
| AN-283-2 | 1979 | 11721A | External Frequency Doubling of the 8662A Synthesized Signal Generator |
| AN-283-3 | ? | 8662A-8663A | Low Phase Noise Applications of the HP 8662A and 8663A Synthesized Signal Generators |
| AN-285 | 1979 | 4904A-4930A | Successful Buried Cable Fault Locating |
| AN-286-1 | 1980 | 8901A | Applications and Operation of the 8901A Modulation Analyzer |
| AN-286-2 | 1981 | 8901A | Accurate Mixer/Amplifier Compression Measurement Using the 8901A Modulation Analyzer |
| AN-287-1 | ? | 5328A | Waveform Analysis Using the 5328A Universal Frequency Counter |
| AN-287-2 | ? | 5345A-5359A | Frequency Profile Using an HP 5345A Electronic Frequency Counter and an HP 5359A Time Synthesizer |
| AN-287-3 | ? | 5370A-5359A | Frequency Profile Using an HP 5370A Universal Time Interval Counter and an HP 5359A Time Synthesizer |
| AN-289 | 1979 | 8165A | A Stimulus for Automatic Test |
| AN-290 | 1980 | - | Practical Temperature Measurements |
| AN-290 | 1997 | - | Practical Temperature Measurements |
| AN-290-1 | 1987 | - | Practical Strain Gage Measurements |
| AN-290-2 | 1982 | 3497A | Using the HP 3497A to Control Industrial Wastewater Treatment |
| AN-290-2 | 1983 | 3497A | Utilisation du HP 3497A pour le contrôle-Commande du Traitement des Eaux Résiduaires Industrielles (French Translation of AN 290-2) |
| AN-291-1 | 1979 | 5345A-5355A | Application Guide to the 5355/56 Automatic Frequency Converter |
| AN-292 | 1979 | 1610A-HP1000 | Minicomputer Analysis Techniques Using Logic Analyzers |
| AN-292-1 | 1981 | 1610A-1615A | Funtional Analysis of the IEEE-488 Interface Bus |
| AN-293 | ? | 1611A | Funtional Analysis of Microprocessor Systems with the 1611A Option 001 General Purpose Module |
| AN-294 | 1979 | 8754A-9825A | Semi-Automatic R.F. Network Measurements Using the HP 8754A Network Analyzer and the HP 9825A Desktop Computer |
| AN-296 | 1980 | 8170A | An Apllications Guide for the 8170A Logic Pattern Generator |
| AN-296-1 | 1980 | 8170A | 8170A Logic Pattern Generator Simulates Multi-Channel Serial Data |
| AN-297-1 | 1981 | 8161A | 8161A Programmable Pulse Generator |
| AN-297-2 | 1981 | 8161A-5370A | 8161A Automated Reverse Recovery Time Measurements of Diodes |
| AN-298-1 | 1980 | 64000 | RS-232-C Communications with HP 64000 Logic Development System |
| AN-298-2 | 1981 | 64000 | Software Project Management with HP 64000 Logic Development System |
| AN-298-3 | 1981 | 64000 | Enhancing 64000 System Assemblers with Model 64851A User Definable Assembler |
| AN-298-4 | 1981 | 64000 | HP 64000 Logic Development System Microassemblers for Bit-slice Processors |
| AN-298-5 | 1980 | 64000 | Using HP 64000 with Logic Development System Computer Networks |
| AN-299 | 1980 | 1336A | Interfacing HP's Model 1336A Display to High-Resolution Imaging Systems |